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Services
SEM (scanning electron microscope)
- Secondary electron imaging
- Backscattered electron imaging
- Standardless elemental analysis including X-ray mapping
- Electron-backscattered diffraction
- Particle counting and sizing
- Image analysis
- Specialized sample preparation
TEM (transmission electron microscope)
- Bright-field imaging
- Dark-field imaging
- Phase identification by electron diffraction
- Particle counting and sizing
- Electron tomography
- Standardless elemental analysis
- Specialized sample preparation
The user fees are intended to cover MicroLab expenses (consumables, parts, maintenance...).
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